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Spatial Point Patterns Analysis

Perform first- and second-order multi-scale analyses derived from Ripley K-function (Ripley B. D. (1977) <doi:10.1111/j.2517-6161.1977.tb01615.x>), for univariate, multivariate and marked mapped data in rectangular, circular or irregular shaped sampling windows, with tests of statistical significance based on Monte Carlo simulations.

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VersionRepositoryFileSize
1.5-12 2026-04-09 windows/windows R-4.5 ads_1.5-12.zip 487.2 KiB

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